NASA Electronic Parts and Packaging (NEPP) Program NEPP Task: Reliability of High-Voltage Tantalum Capacitors
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Effect of Preconditioning and Soldering on Failures of Chip Tantalum Capacitors
Soldering of molded case tantalum capacitors can result in damage to Ta2O5 dielectric and first turn-on failures due to thermo-mechanical stresses caused by CTE mismatch between materials used in the capacitors. It is also known that presence of moisture might cause damage to plastic cases due to the pop-corning effect. However, there are only scarce literature data on the effect of moisture co...
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Over the past ten years, NASA has studied the effects of harsh environments on optical fiber assemblies for communication systems, lidar systems, and science missions. The culmination of this has resulted in recent technologies that are unique and tailored to meeting difficult requirements under challenging performance constraints. This presentation will focus on the past mission applications o...
متن کاملCharacterization of Tantalum Polymer Capacitors
Solid-electrolyte tantalum capacitors were first developed and commercially produced in the 1950s. They represented a quantum leap forward in miniaturization and reliability over existing wound-foil wet electrolytic capacitors. While the solid tantalum capacitor has dramatically improved electrical performance versus wet-electrolyte capacitors, especially at low temperatures, today’s electronic...
متن کاملScintillation Breakdowns in Chip Tantalum Capacitors
Scintillations in solid tantalum capacitors are momentarily local breakdowns terminated by a self-healing or conversion to a high-resistive state of the manganese oxide cathode. This conversion effectively caps the defective area of the tantalum pentoxide dielectric and prevents short-circuit failures. Typically, this type of breakdown has no immediate catastrophic consequences and is often con...
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تاریخ انتشار 2011